Camfil’s Scanning Electron Microscope (SEM), located at the laboratory in Trosa, is a great example of how committed we are to research and development. This unique tool allows us to study and identify contaminants as small as 50nm (=0,00005mm), found in used filters and air samples. The microscope is used as a problem solving and quality control capability for our customers, and also to study and evaluate new filter media.
Images from top to bottom, left to right:
- Loading of samples into the Scanning Electron Microscope
- Air sample showing the very smallest of particles flying around in the air, from traffic exhaust fumes
- Particles caught in a filter, studied in the SEM